Memory ATE
Reinforcing reliable memory to secure the foundation of AI data
Repair During Burn-In Tester
S9620 is an integrated high-capacity DRAM tester launched by SEICHITECH to improve DRAM test efficiency and accuracy while reducing test costs. It supports burn-in test and core test on DRAM chips of DDR4, DDR5, LPDDR4, and LPDDR5 device.
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Product Advantages
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01High capacity: Supports 23040 DUTs for parallel testing
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02High integration: Supports burn-in testing, high- and low-temperature testing, and core testing, effectively saving space and shortening transition time between burn-in and core testing
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03High data rate: Supports test data rate up to 100 MHz / 200 Mbps
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04Wide temperature range: The test temperature ranges from -10°C to 150°C
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05High precision: The clock edge resolution is 625 ps, and the temperature control accuracy of high- and low-temperature burn-in chamber is ±1.0°C
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06High precision: The clock edge resolution is 625 ps, and the temperature control accuracy of high- and low-temperature burn-in chamber is ±1.0°C
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07Easy operation: Supports various interactive modes such as command line and graphical user interface (GUI), provides abundant visual tools and software interfaces, and is compatible with common C language test programs
Product
Features
Target Devices
DDR4/5, LPDDR4/5
Test Data Rate
100MHz/200Mbps
Parallel Testing Support
Supports 23,040 DUTs in total
Technical Parameters
Digital Channel: 46080ch/sys;
Device Power Supply: 960 HCPPS+960 HVPPS+ 960 TMPS+240 PPS
Edge Resolution: 625ps
Timing Set: 16
DR/IO Range: 1V-2.1V
