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Reinforcing reliable memory to secure the foundation of AI data
Memory ATE

Reinforcing reliable memory to secure the foundation of AI data

Chip Probing Tester

Chip Probing Tester

S9930 is a high-speed, high-precision DRAM chip probing and repair equipment launched by SEICHITECH to improve DRAM test efficiency and accuracy while reducing test costs.
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Product Advantages

  • 01
    High Rate: Supports test data rate up to 2.25Gbps
  • 02
    High Precision: Clock resolution is 3.47ps, supporting evolution to 1ps
  • 03
    High Capacity: Supports 2,048 DUTs for parallel testing
  • 04
    Self-Repair: Supports quick repair of defective chips
  • 05
    Automation: Supports connection with mainstream probers for intelligent production
  • 06
    Easy Operation: Supports various interactive modes such as command line and graphical user interface (GUI), and provides abundant visual tools and software interfaces
  • 07
    Easy Upgrade: The whole architecture supports smooth evolution into the next generation of DRAM
  • 08
    High Compatibility: Shares a set of host software with other SEICHITECH DRAM test equipment and is compatible with common C language test programs
  • 09
    Easy Maintenance: Supports equipment self-diagnosis and optimization to reduce operation and maintenance costs

Product
Features

Target Devices
DDR4/5，LPDDR4/5
Test Data Rate
200MHz/400Mbps, which could upgrade to 1.125GHz/2.25Gbps
Parallel Testing Support
Supports 2048DUT per TD
Technical Parameters
Digital Channel: 4096 DR+5120 IO Device Power Supply: 8192 DPS @1A Edge Resolution: 3.47ps, which may evolve into 1ps Timing Set: 16 DR/IO Range: -0.5V-1.9V/30mA

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