国产欧美丝袜在线二区_久久久精品无码中文天美_国产成人欧美亚洲日韩电影_99re6热视频这里只精品首页_成人午夜av亚洲精品无码网站_色欲av久久一区二区三区_中文字幕亚洲欧美在线不卡_亚洲中文无码av永久不收费_国产亚洲欧美精品永久_亚洲欧美日本va在线播放

Leading Micro-Display Inspection Technology to Empower Next-Gen Interactive Experiences for AI Terminals
XR Inspection Equipment

Leading Micro-Display Inspection Technology to Empower Next-Gen Interactive Experiences for AI Terminals

Imaging Luminance Meter

Imaging Luminance Meter

Widely used for measuring brightness uniformity and detecting defects in display devices, Micro-LED, Mini-LED, AR/VR near-eye displays, vehicle displays, backlight modules, and optical modules, the meter quickly captures brightness distribution information across the entire surface of the object under test. It accurately measures core optical parameters including brightness and luminance uniformity, supports single-pixel refined detection, and efficiently identifies subtle defects such as dark spots, bright spots, and Mura (non-uniform brightness) on the luminous surface.
Scroll to Explore

Product Advantages

  • 01
    Uses a high-resolution CMOS sensor with micron-level spatial resolution, suitable for testing Micro-LED, OLED, and other micro-display devices
  • 02
    The luminance distribution map of the entire display area can be captured in a single acquisition, which significantly improves measurement efficiency
  • 03
    It can be integrated with auto focus, auto exposure, and industrial interfaces, suitable for automatic test systems on production lines
  • 04
    Open measurement and analysis capabilities support a variety of customization requirements. With a high-consistency and high-stability design, it is suitable for engineering and production line applications

Product
Features

1. 2D Luminance Distribution Measurement: Obtains luminance distribution images of the object under test in real time and calculates key indicators such as maximum value, minimum value, mean, and uniformity 2. ROI Analysis and Batch Statistics: Supports multiple ROI setting methods such as single point, rectangle, and array, suitable for pixel-level and module-level luminance analysis 3. Brightness Consistency and Defect Evaluation: Can be used for detecting brightness anomalies, evaluating brightness uniformity, detecting dark spots and bright spots, performing trend analysis, and supporting process and yield evaluation 4. Calibration and Data Traceability Support: Supports system-level brightness calibration process and makes measurement results traceable to meet the needs of R&D and customer audits